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Published December 2009 | Published
Journal Article Open

High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films


High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition. Even for highly textured films, our diffraction technique provides detection of diffraction from each family of Bragg reflections, which affords direct comparison of the measured profiles with powder patterns of known phases. These techniques are important for high throughput combinatorial studies as they provide structure and composition maps which may be correlated with performance trends within an inorganic library.

Additional Information

© 2009 American Institute of Physics. Received 19 October 2009; accepted 22 November 2009; published online 28 December 2009. This work is based upon research conducted at the Cornell High Energy Synchrotron Source (CHESS) which is supported by the National Science Foundation and the National Institutes of Health/National Institute of General Medical Sciences under NSF award DMR-0225180. This work was also supported by the Cornell Fuel Cell Institute funded by the Department of Energy (Grant No. ER06-02-13022-11751-11792). The authors thank Michele Tague, Anna Legard, and Taro Naoi for assistance in data acquisition.

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